菠菜担保网

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA? electrical characterization and PeakForce QNM? quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.

Features

For detailed specifications, please contact EPC!